Beschreibung
Inhaltsangabe1 Introduction to Machine Learning Part Two. 2 Two-stage Least Squares. 3 Multiple Imputations. 4 Bhattacharya Analysis. 5 Quality-of-life (QOL) Assessments with Odds Ratios. 6 Logistic Regression for Assessing Novel Diagnostic Tests against Control.7 Validating Surrogate Endpoints. 8 Two-dimensional Clustering. 9 Multidimensional Clustering. 10 Anomaly Detection. 11 Association Rule Analysis. 12 Multidimensional Scaling. 13 Correspondence Analysis. 14 Multivariate Analysis of Time Series. 15 Support Vector Machines. 16 Bayesian Networks. 17 Protein and DNA Sequence Mining. 18 Continuous Sequential Techniques. 19 Discrete Wavelet Analysis. 20 Machine Learning and Common Sense. Statistical Tables. Index.
Produktsicherheitsverordnung
Hersteller:
Springer Verlag GmbH
juergen.hartmann@springer.com
Tiergartenstr. 17
DE 69121 Heidelberg
Autorenportrait
Inhaltsangabe1 Introduction to Machine Learning Part Two. 2 Two-stage Least Squares. 3 Multiple Imputations. 4 Bhattacharya Analysis. 5 Quality-of-life (QOL) Assessments with Odds Ratios. 6 Logistic Regression for Assessing Novel Diagnostic Tests against Control.7 Validating Surrogate Endpoints. 8 Two-dimensional Clustering. 9 Multidimensional Clustering. 10 Anomaly Detection. 11 Association Rule Analysis. 12 Multidimensional Scaling. 13 Correspondence Analysis. 14 Multivariate Analysis of Time Series. 15 Support Vector Machines. 16 Bayesian Networks. 17 Protein and DNA Sequence Mining. 18 Continuous Sequential Techniques. 19 Discrete Wavelet Analysis. 20 Machine Learning and Common Sense. Statistical Tables. Index.
